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Enables the use of Hitachi 15 and 25mm mounts with M4 thread on JEOL SEMs (including JEOL NEOSCOPE)
Premounted on half washer mounts for easy exchange
Roughness: Typically 2-3Å
It also holds two FIB grids conveniently close to the sample to mount and prepare TEM lamellae on the FIB grid for subsequent TEM imaging
excellent edge definition
ATEC-CONTAu-10 5X Enables the use of HitachiDESCRIPTION AdvancedTEC Silicon SPM Probe, silicon cantilever for contact mode, detector and tip side: Au coating
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